OVERVIEW OF CONFERENCE PROGRAM:August 7-9

 

    Note: The information is only for your reference. The final conference schedule shall prevail on the date of conference.

PROFESSIONAL DEVELOPMENT COURSE:August 7

PDC-1 08:30-10:00

PDC-1 08:30-10:00

Reliability and industrialization of a new SnZnBiInP lead-free solder series

Prof. Jusheng MA

Tsinghua University, China                                                                                                                                                                                                 

PDC-2 08:30-10:00

PDC-2 08:30-10:00

Chiplet Design and Heterogeneous Integration Packaging

Dr. John H. LAU

Unimicron Technology Corporation, Taiwan, China                                                                                 

PDC-3 10:20-11:50

PDC-3 10:20-11:50

"Less is Moore" for Chiplets and Glass Substrates

Dr. Wei Koh

Pacrim Technology Irvine, CA, USA                                                                                                                          

PDC-4 10:30-12:00

PDC-4 10:30-12:00

The Heterogeneous Integration Package Development Trend

Mr. Scott CHEN

SVP of Central Development Engineering in ASE (Advanced Semiconductor Engineering), Taiwan, China                                         

PDC-5 13:30-15:00

PDC-5 13:30-15:00

High Reliability Soldering in Semiconductor Packaging

Dr. Ning-Cheng Lee

ShinePure Hi-Tech, China                                                                                                            

PDC-6 13:30-15:00

PDC-6 13:30-15:00

Multi-scale multi-field simulation for chip design

Prof.  Sheng LIU

Academician of CAS, Dean of School of Power and Mechanical Engineering, Wuhan University                                                                


PDC-6 13:30-15:00


Prof. Yuzheng GUO

Vice Dean of School of Power and Mechanical Engineering, Wuhan University                                                                

PDC-7 15:20-14:50

PDC-7 15:20-14:50

Moisture Reliability, Failure Mechanisms and Modeling in Semiconductor Packaging

Prof. Xuejun FAN

Lamar University, Beaumont, Texas, USA                                                                                                                  

PLENARY TALKS:August 8

08:30-09:10 OPENING CEREMONY

Chair: Prof. Kouchi ZHANG, Delft University of Technology, Netherlands

Welcome address: Prof. Tianchun YE, Chair of ICEPT

                                Prof. Yong JIANG, Tiangong University                                                                                       

                                Dr. Kitty PEARSALL, IEEE EPS                                                     

Chair: Prof. Johan LIU, Chalmers University of Technology, Sweden

09:10-09:40

09:10-09:40

Entransy and Electronics Packaging Thermal Management

Prof. Zengyuan GUO

Academician of CAS



09:10-09:40


Prof. Xiaobing LUO

Dean of the School of Energy and Power Engineering at Huazhong University of Science and Technology                                                                                                                   

09:40-10:10

09:40-10:10

DfX for Power Electronics with Super High Reliability

Prof. Sheng LIU

Academician of CAS, Dean of School of Power and Mechanical Engineering, Wuhan University                                                                                                                       

10:10-10:30 Tea Break & Networking

 

10:30-11:00 

10:30-11:00 

Semiconductor Supply ChainEco SystemOverview

Dr. Kitty PEARSALL

IEEE EPS                                                                                                                                                                   

11:00-11:30

11:00-11:30

Trends and Challenges of Third-Generation Semiconductor Components in Digital Power

Dr. Zhaozheng HOU

Director of the Technology Planning Dept of the R&D Mgmt Dept, Huawei Digital Power Technologies Co., Ltd.                                          

11:30-12:00

11:30-12:00

Low Temperature Sintering of Nanosilver Paste for High Temperature Electronic Package

Prof. Yunhui MEI

Executive Vice President of School of Electrical Engineering Tiangong University                                                                         

12:00-13:30 Lunch

 

Chair: Tadatomo SUGA, Professor Emeritus of the University of Tokyo, Professor of Meisei University

13:30-14:00

13:30-14:00

Co-Packaged Optics - Heterogeneous Integration of Photonic IC and Electronic IC

Dr. John H. LAU

Unimicron Technology Corporation                                                                                                                                            

14:00-14:30

14:00-14:30

Metal/Dielectric Hybrid Bonding for Heterogenous Integration Applications

Dr. Viorel Dragoi

Chief Scientist, EV Group, Austria                                                                                                               

14:30-15:00

14:30-15:00

Recent Advances in Semiconductor Package Warpage Management

Prof. Xuejun FAN

Lamar University, Beaumont, TX                                                                                                                                                 

15:00-15:30

15:00-15:30

Industrial Testing of 3D Heterogeneous Chip-Package-PCB-Antenna Modules via Advanced Electromagnetic-Thermal Analysis

Prof. Andrew Tay

IEEE EPS Region 10 Director                                                                                                                                                            

15:30-15:50 Tea Break & Networking

 

Chair: Prof. Ricky LEE, Hongkong University of Science & Technology, China

15:50-16:20

15:50-16:20

Advanced 3D Packaging for AI Application

Dr. YP WANG

Vice President, R&D Center, Siliconware Precision Industries Co., Ltd.                                                          

16:20-16:50

16:20-16:50

Manufacturing Technology Solution of Wafer / Panel Level Packaging for Chiplet Integration

Mr. Motoshi Kobayashi

General Manager of ULVAC, Inc.                                                                                                                                             

16:50-17:20

16:50-17:20

2.5D/3D Packaging PVD Equipment Solution

Dr. Jianheng LUO

Packaging Product Manager of PVD Business Unit, NAURA                                                            

17:20-17:50

17:20-17:50

Applications & Challenges of TCB in Chiplet Technology

Dr. Hong XIE

Tongfu Microelectronics                                                                                                                                               

17:50-18:20

17:50-18:20

Chiplets Turn 65!

Dr. Charles E. Bauer

Senior Managing Director TechLead Corporation                                                                                                

18:20-21:00 Welcome Dinner

 

ORAL & POSTER SESSIONS:August 9

 


Overview of Oral Presentation Sessions

Friday, August 9th, 8:30-18:15  3F

Recent Progress in Surface Activated Bonding for WBG Semiconductors and All-Metal 3D Interconnects

Prof. Tadatomo SUGA 

University of Tokyo & Meisei University                                                                                               

New interconnect material for high-reliability SiC power modules

A.Prof Chuantong CHEN  

Osaka University                                                                                                                                         

AI-enhanced Simulation for Power Package Design

Haibo FAN  Senior Principal Engineer

Nexperia Hong Kong                                                                                                                                                               

Design and Process Considerations for 2.5 Interposer Technology

Prof. Gu-Sung Kim

Kangnam University                                                                                                             

Novel MEMS Passive Elements: Wafer-level Fabrication and System Integration

A.Prof. Sixing XU 

Hunan University                                                                                                                                                               

Study on the moisture induced failure for advanced embedded packaging

Dr. Meiying SU

Institute of Microelectronics of the Chinese Academic Sciences                                                               

Research on Defect Inspection Technology for Bumping in IC Packaging

Dr. Zili ZHANG

Institute of Microelectronics, Chinese Academy of Sciences                                                                                         

Discussion of Substrate-Embedded SiC Power Module Packaging Technology

Dr. Fengze HOU

Institute of Microelectronics of the Chinese Academy of Sciences                                                                

DTCO for warpage & thermal control in wafer level advanced packaging

Xin WANG  CTO, VP of R&D

Hangzhou Microsilicon Technology Co.,Ltd                                                                                                                

Photo-patternable High-RI TiOx Spin-on Materials for Silicon Photonics Applications

Wei-Su CHEN  Deputy General Manager

Quantech (Guangzhou) New Materials Co., LTD                                                                                                      

The Application of Multiphysics Simulation in Advanced Packaging

Anran WEI  Application Engineer

COMSOL China                                                                                                                                             

Nano-scale TSV Development and Its Application

Ziyu LIU  Associate Professor

Fudan University                                                                                                                        

Measurement and characterization in wide bandgap semiconductor devices

Dr. Xuefeng ZHENG

Xidian University                                                                                                                                                

Board Level Interconnect Reliability under Harsh Conditions – Testing, Modelling and Prognostic Perspectives

Karsten Meier  Senior Researcher

Assistant Director, Technische Universität Dresden                                                                                                   

Maximize the performance of SiC device with advanced sinter technology

Jing ZHANG  Head of Shanghai Innovation Center

Heraeus Electronics China, Heraeus Materials Technology Shanghai Ltd                                                                                   

Nanotwinned silver films for low-temperature interconnection: magnetron sputtering deposition, microstructure optimization, and thermo-compression bonding

Prof. Hongjun JI

Harbin Institute of Technology, Shenzhen                                                                                                                                            

Advanced 3D Heterogeneous Integration of a 40+ TOP/W AI Core Accelerator

Farhang Yazdani  CEO

BroadPak Corporation                                                                                                                                       

 

High Density Glass Core Package Substrate

Prof. Chengqiang CUI

Guangdong University of Technology, Guang Dong FoZhiXin microelectronics Technology Research Co.Ltd.

Advanced Packaging Processes and Co-Design Simulation Solutions for 2.5D Integration

Jiaqi FAN  Advanced Packaging Design Manager

National Center for Advanced Packaging Co., Ltd.(NCAP China)                                                                                               

Research on Cu/SiO2 Hybrid Bonding for Chiplet Integration

 Dr. Junpeng FANG

School of Integrated Circuits,Tsinghua University                                                                                                    

Flexible Hybrid Electronics for Healthcare and Robotics

Prof. Hao WU

Huazhong University of Science and Technology                                                                                                  

AI Assisted Electronic Packaging Technology and Reliability Evaluation

A.Prof Yanwei DAI  

Beijing University of Technology                                                                                                                     

TO-Based Design Optimization Methods for SiC MOSFET Power Modules

A.Prof  Gaojia ZHU

Tiangong University                                                                                                                               

Glass Core Substrate: Next Gen Advanced Packaging Technology

Jiamiao TANG  General Manager FCBGA

AKM Meadville Electronics (Xiamen) Co., Ltd.                                                                                                                

Design and Development of Biotelemetry Sensors for Marine Animal and Environmental Monitoring

Dr. Yang YANG

Institute of Deep-sea Science and Engineering,CAS                                                                                                      

Applied Reliability for Mobile and Auto Products

Huicai MA  Director of Design for Reliability Department

Beijing Xiaomi Mobile Software Co., Ltd                                                                                                            

Predictive Design and Modeling on Fan-Out Technology

Dr. Faxing CHE

Senior Member of Technical Staff, Micron Semiconductor Asia Operations Pte. Ltd                                                                              

Low melting point solder for high density bonding in 3D IC technology

Yingxia LIU  Assistant Professor

City University of Hong Kong                                                                                                              

The Trends of Optical interconnection technology in AI computing center

Yuan ZHANG  Freelancer                                                                                                                

Thermo-mechanical fatigue life prediction of SiC power device based on finite element simulation

Dao-Hang LI  Research Assistant

Tiangong University                                                                                                                                                                   

Heterogeneous integration of Micro-LED and CMOS for AR-display applications

Prof. Jianhua ZHANG

Vice President of Shanghai University and Executive Dean of the School of Microelectronics at Shanghai University                       

CONCURRENT EXHIBITION:August 8-9

CONCURRENT EXHIBITION

List is updating……